MIL-PRF-44259E
4.4.7 Dielectric protector test. One light assembly from the sample light set shall be
tested for a dielectric load for the period as specified in 3.4.7. Any inability to accept the
specified voltage for this minimum time period without disruptive discharge or any current
leakage shall constitute a test failure.
4.4.8 Electrical continuity for light assemblies. Each conductor in the electrical light
assembly shall be tested in accordance with Method 303 of MIL-STD-202. The test current shall
not exceed 15 milliamperes and the test resistance shall not exceed 1 ohm. Measurement shall
be made between each connector pin, which is mutually common to each other electrically. The
continuity for each pin shall be checked for compliance with the continuity requirement of 3.4.9
and failure to conform to continuity requirement shall constitute a test failure.
4.4.9 Insulation resistance for light set assemblies. With the light switch "OFF", the
light set assembly shall be tested in accordance with Method 302 of MIL-STD-202. The test
potential shall be 500 volts, test condition B. Insulation resistance measurement shall be made
between the mutually insulated points and between insulated points and shell or ground. Each
resistance measurement shall be checked for compliance with the insulation resistance
requirement of 3.4.9. Failure to conform to the continuity requirement shall constitute a test
failure.
4.4.10 High and low temperature storage test. The sample light assemblies in their
packaged form shall be tested for high temperature storage in accordance with Method 501,
procedure I, of MIL-STD-810. The test temperature and cycle shall be as specified under hot
induced conditions with a minimum of seven complete cycles. The sample light set shall then be
tested for low temperature storage in accordance with Method 502, procedure I, of
MIL-STD-810. The test temperature shall be severe cold (C3) (-60 °F) with the duration of
exposure at 8 hours. After each storage test the sample light assemblies shall be removed from
the test chamber, allowed to stabilize at room temperature, then operated. Failure to conform to
the requirements of 3.5.1 shall constitute a test failure.
4.4.11 High temperature operation test. Each of the sample light assemblies shall be
tested for high temperature operation in accordance with method 501, procedure II, of
MIL-STD 810. The test temperatures and cycle shall be as specified under hot, ambient air
conditions. The light assemblies shall be hooked up in series and shall be operated through three
complete temperature cycles. Failure to conform to the requirements of 3.5.2 shall constitute a
test failure.
4.4.12 Humidity test. The sample light assemblies shall be tested for resistance to
humidity with the light assemblies set up in series and exposed to chamber conditions. The test
shall be conducted in accordance with Method 507, procedure I, cycle 2 (quick look) of
MIL-STD-810. Operational checks are required during testing as specified in MIL-STD-810.
During operational checks, the light assemblies shall be operated for 1 hour under chamber
conditions. Failure to conform to the requirements of 3.5.3 shall constitute a test failure.
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